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ISSN 2575-6206
Original article
Vol. 9, Issue 4, 2025November 16, 2025 CDT

Automated particle detection in Atomic Force Microscopy images of environmental films using two novel algorithms

Eric Zang,
Image processing algorithmsParticle identificationAtomic Force MIcroscopyEnvironmental filmsAutomated image analysisWhite top-hat transformAdaptive Gaussian thresholdHigh-throughput algorithmsComputational efficiencyMaterials science
Copyright Logoccby-nc-sa-4.0 • https://doi.org/10.64336/001c.147429
Journal of High School Science
Zang, Eric. 2025. “Automated Particle Detection in Atomic Force Microscopy Images of Environmental Films Using Two Novel Algorithms.” Journal of High School Science 9 (4): 209–29. https:/​/​doi.org/​10.64336/​001c.147429.

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